First Announcement

Dear Sir/Madam, we are glad to inform you about the 24th  Conference on Scanning Electron Microscopy (SEM-2012), organized by the Scientific Committee of the Russian Academy of Sciences on Electron Microscopy, Institute of Microelectronics Technology and High Purity Materials  RAS, Chernogolovka  and  Institute of  Crystallography  RAS, Moscow, which will be held in Chernogolovka on May-June, 2012. 
The program of the Conference includes original talks, poster communications, round tables and informal discussions of present-day achievements in scanning electron microscopy together with instrumentation and methodology and main applications.

                              Organizing Committee SEM2011:        

Chairman:
  Prof. Kiselev N.A. - co-chairman

  Prof. Koval'chuk M.V. - co-chairman
  Prof. Tylin V.A.- co-chairman

Vice-chairman: 
  Dr. Kazmiruk V.V. 
  Dr. Kanevskii V.M.

Scientific Secretary:
  Goltsova N.P. - secretary

Prof. Aronin A.S., Dr. Grigor'ev Yu.V., Prof. Kveder V.V.,
Prof. Avilov A.S., Dr. Artemov V.V., Dr. Vasil'ev A.L.,
Dr. Gainutdinov R.V., Dr. Dicman S.A., Kaz'miruk L.A.,
Dr. Osipov N.A., Prof. Popenko V.I., Dr. Raevskii V.L.,
Prof. Didenko L.V., Prof. Klechkovskaya V.V.,
Prof. Klimenko S.M., Prof. Rau E.I., Prof. Sokolov V.N.,
Prof. Tolstihina A.L., Prof. Hodos I.I.
Dr. Shtein-Margolina V.A., Prof. Yakimov E.B.

 

List of Invited Scientists

Invited Participation :

The Organizing Committee of the Conference invites leading Russian scientists in the field of electron microscopy, representatives of the Russian industry dealing with the design and production of electron probe equipment, and graduates of Russian high schools showing interest to electron microscopy.
Foreign scientists wishing to participate in the 24th  Conference on Scanning Electron Microscopy (SEM-2012), and representatives of foreign firms are also kindly invited to the Symposium.

                   Symposium Topics

               Transmission electron microscopy (analytical, low-voltage, scanning).
               Electron microscopy in the studies of new materials, nanostructures included.
               Methods of electron diffraction and electron crystallography.
               Electron optics and new instruments.
               Probe scanning microscopy.
               Scanning electron microscopy.
               Focused electron and ion beams in the analysis of materials.
               Electron and ion lithography.
               Electron and probe microscopy in chemistry and geology.
               Electron, probe and focal scanning microscopy in biology and medicine.


The aim of the Conference is to cover recent developments in scanning microscopy (electron and probe) and analytical methods of investigation applied for solid states physics, material science, nanotechnology, chemistry, biology and medicine.      

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Registration fee: 200 EURO (reduced for FSU participants) may be paid during registration.

The 24th  Conference on Scanning Electron Microscopy (SEM-2012) will be held in Chernogolovka - Research Center of the Russian Academy of Sciences. Chernogolovka is located 50 km north off Moscow.

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Visa Application

Dear colleagues,

For visa, please fill in the enclosed visa form, and return it by e-mail:   
giza@iptm.ru   kazmiruk@iptm.ru
or send it by fax: 962-80-47

Attention!
Deadline for returning the visa form is March 30  2012!

The Organizing Committee will apply for your visas to the Russian Consulates in your countries.

The Organizing Committee will send the information necessary for visa application to your address in due time. 

Payment for the visa, according to the existing tariff, and receiving the visa are at the Russian Consulate in your country.

For problems, suggestions, or questions, please contact the Symposium